Products

Opus

A standalone product line for reporting, point analysis, I++ device communication, and laser tracker operation — when you need metrology tools outside of SOLIDWORKS.

Overview

Metrology tools that stand on their own

Opus is a family of standalone applications for engineers and inspectors who need metrology capabilities outside of a SOLIDWORKS environment — including reporting, point analysis, device communication, and laser tracker operation.

Standalone operation

No SOLIDWORKS license required. Opus runs independently on any Windows workstation.

Compatible with Sitius CMM Suite

Opus applications share data formats with Sitius CMM Suite — results and reports move seamlessly between environments.

Wide device support

Connect to CMMs, laser trackers, and I++ DME capable devices directly from the Opus environment.

Opus Viewer

View and share inspection results

Opus Viewer lets anyone review inspection results and reports — no full Sitius license needed. Available in free and paid editions.

Free edition

View inspection results and reports without a full Sitius license — share with customers, suppliers, or colleagues.

Paid edition

Extended capabilities for more detailed result navigation, annotations, and export options.

SPV

Standalone Point-to-CAD Comparison

SPV brings Sitius point-to-CAD comparison and GD&T analysis to environments where SOLIDWORKS is not available.

CAD comparison without SOLIDWORKS

Compare point data to CAD geometry and evaluate geometric tolerances outside of the SOLIDWORKS environment.

GD&T analysis

Full geometric tolerance evaluation including best-fit analysis and graphical reporting.

I++ Client for Opus

On-line CMM communication

The I++ Client for Opus enables direct communication with I++ capable CMMs for on-line inspection — standalone, no SOLIDWORKS needed.

I++ DME protocol

Connect to any I++ DME capable CMM for on-line measurement directly from the Opus environment.

Standalone operation

No SOLIDWORKS required — drive your CMM and collect data from any workstation running Opus.

Laser Tracker App

Laser tracker operation and data collection

The Sitius Laser Tracker App in Opus enables direct control and data collection from laser trackers — bringing the same CAD-based inspection philosophy to large-scale metrology.

Tracker control

Operate laser trackers directly from Opus — target acquisition, measurement, and data collection in one environment.

Large-scale metrology

Ideal for large parts and assemblies where a CMM is not practical — aerospace structures, tooling, fixtures.

Interested in Opus?

Contact us to learn more about licensing, editions, and supported devices.